EAG Lighting/LED Solutions

Evans Analytical Group® (EAG) provides world class support of research, development and fast-response production monitoring for LED epitaxial composition depth profiles for both ultra-thin and thick layers, resulting in production cost savings and improved lot-to-lot product performance.

In addition, EAG provides analytical support for LED packaging development and contamination analysis.

Application Examples

• Layer thickness and density determination
• Full wafer layer thickness mapping
• Stress in emitaxial layers
• Crystalline orientation
• Depth profiling dopants and impurities in AlGaInP and GaN epilayers
• Measuring layer thickness and composition of AlInGaP and AlGaN films
• Controlling the common impurities H,C and O in MOCVD epitaxy with very low detection limits
• Characterization of crystal quality of AlInGaP and InGaN MQWs
• Examining the cross-sectional structure of LEDs
• Full reverse engineering of finished LEDs
• Failure analysis
• Identifying contamination both organic and inorganic contaminations in LEDs
• Problem solving in adhesion of metal stack on semiconductor

Application Notes