EAG Solar & Energy Solutions

Surface analytical techniques can provide valuable insight into photovoltaic materials and their processing, showing how they correlate to device performance. This information can then be used to reduce contamination and defects and improve manufacturing processes, thus increasing yields and lowering costs.

Evans Analytical Group® (EAG) with its wide array of analysis techniques and world-class scientists can provide fast, state-of-the-art measurements that can help give you the insight you need to improve your product’s performance and manufacturing yield.

Application Examples

• Accurately measuring layer composition and thickness to within a few percent in materials including c-Si, α-SiGe, α-SiGe, CdTe, ITO and more
• Characterizing dopant dose and profile shape
• Identifying and locating trace level impurities in layers and at interfaces
• Identifying grain structure differentiating between c-Si, α-Si and poly-Si
• Measuring average grain size in thin poly-Si films
• Examining the cross-sectional structure, orientation, layer thickness and film integrity
• Identifying particle contamination
• Identifying organic contamination on Si wafers
• Assessing the cleaning efficacy by quantifying surface metals on Si wafers

Application Notes