Fourier Transform Infrared Spectroscopy (FTIR)

Fourier Transform Infrared Spectroscopy (FTIR) provides specific information about chemical bonding and molecular structures, making it useful for analyzing organic materials and certain inorganic materials. Chemical bonds vibrate at characteristic frequencies, and when exposed to infrared radiation, they absorb the radiation at frequencies that match their vibration modes. Measuring the radiation absorption as a function of frequency produces a spectrum that can be used to identify functional groups and compounds.

Evans Analytical Group® (EAG) primarily uses FTIR to assist our customers with identifying and analyzing materials and/or contaminants. For example, we work with you to determine if a device component is contaminated. If it is, we can use FTIR to help determine what the contaminant is, so you can eliminate the source.

Our scientists are highly educated and knowledgeable in the use of FTIR. We believe that our experience with many different materials cannot be matched at any competing labs. Plus, you can count on fast turnaround times, accurate data, and person-to-person service, ensuring you understand the information that you receive.

View Application Notes

Ideal Uses for FTIR Analysis		Relevant Industries for FTIR Analysis
Identifying the molecular structure of organic compounds for contamination analysis Identification of organic particles, powders, films, and liquids (material identification) Quantification of O and H in Si, and H in SiN wafers (Si-H vs. N-H) Contamination analysis (extracts, outgassed products, residues)		Aerospace Automotive Biomedical/biotechnology Compound Semiconductor Data Storage Defense Displays Electronics Industrial Products Lighting Pharmaceutical Photonics Polymer Semiconductor Solar Photovoltaics Telecommunications
Strengths of FTIR Analysis		Limitations of FTIR Analysis
Capable of identifying organic functional groups and often specific organic compounds Extensive spectral libraries for compound identification Ambient conditions (not vacuum; good for volatile compounds) Typically non-destructive Minimum analysis area: ~15 micron		Limited surface sensitivity (typical sampling volumes are ~0.8 µm) Minimum analysis area: ~15 micron Limited inorganic information Typically not quantitative (needs standards)

Application Notes