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Thank you for your interest in EAG. Please provide us with your contact information and a brief description of what you would like to discuss and we will have the appropriate person contact you.

In order to best address your specific analytical needs, feel free to provide additional information such as failure mode/signature, history, origin (manufacturing, yield, field, qualification testing, etc.), and other pertinent details.

 

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TEM Technical Capabilities

Signal Detected:
  • Transmitted electrons, scattered electrons, x-rays
Elements Detected:
  • EDS: B-U
Detection Limits:
  • ~1 nm sized particles; otherwise 1%
Depth Resolution:
  • Samples must be thinned to be analyzed and are thinned down to 30-1000 nm, depending on application and tool.
Imaging/Mapping:
  • Yes
Ultimate Lateral Resolution:
  • <0.5 nm